With the increased complexity of modern integrated circuits, it is important that reliability problems be attacked properly with the appropriate tools. This volume recognizes that almost all reliability problems are materials problems, and helps to put 'reliabilty physics' on a firm scientific foundation. Topics include: electromigration; stress effects on reliability; stress and packaging; metallization; device, oxide and dielectric reliability; new investigative techniques; corrosion.
This well-established and well-regarded reference work offers unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and el
The author of the Kurt Cobain biography "Heavier Than Heaven" examines the legacy of the Nirvana frontman and discusses why he still matters twenty years after his death.
A definitive portrait of rock legend Jimi Hendrix, honoring the thirty-fifth anniversary of the musician's death, captures the full span of Hendrix's life, from his troubled childhood and battles agai
Novel measurement techniques, microstructural effects, reliability modelling, stress effects, advanced interconnect reliability, and adhesion and fracture are the concerns of the 49 papers. Invited pr
