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【簡體曬書區】 單本79折,5本7折,活動好評延長至5/31,趕緊把握這一波!

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原文書 (6)

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可訂購商品 (6)

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無庫存 (6)

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$800以上 (6)

出版日期


2024年 (2)
2020~2021 (3)
2016年以前 (1)

裝訂方式


平裝 (2)
精裝 (4)

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;Iwanczyk, Jan (DxRay Inc., USA.),Iniewski, Krzysztof (2)
Iniewski, Krzysztof (Redlen Technologies Inc., Canada.),Iwanczyk, Jan S. (DxRay Inc., USA.) (1)
Iwanczyk, Jan (DxRay Inc., USA.),Iniewski, Krzysztof (1)
Iwanczyk, Jan (DxRay Inc., USA.),Iniewski, Krzysztof (Emerging Technologies CMOS Inc., British Columbia, Canada) (1)
Jan S. Iwanczyk (EDT) (1)

出版社/品牌


PBKTYFRL (5)
Productivity Press (1)

三民網路書店 / 搜尋結果

6筆商品,1/1頁
Radiation Detection Systems:Sensor Materials, Systems, Technology, and Characterization Measurements
90折

1.Radiation Detection Systems:Sensor Materials, Systems, Technology, and Characterization Measurements

作者:Iwanczyk; Jan (DxRay Inc.; USA.); Iniewski; Krzysztof  出版社:PBKTYFRL  出版日:2024/05/27 裝訂:平裝
定價:2989 元, 優惠價:9 2690
預購中
Radiation Detection Systems:Medical Imaging, Industrial Testing, and Security Applications
90折

2.Radiation Detection Systems:Medical Imaging, Industrial Testing, and Security Applications

作者:Iwanczyk; Jan (DxRay Inc.; USA.); Iniewski; Krzysztof  出版社:PBKTYFRL  出版日:2024/05/27 裝訂:平裝
定價:2989 元, 優惠價:9 2690
預購中
Radiation Detectors for Medical Imaging

3.Radiation Detectors for Medical Imaging

作者:Jan S. Iwanczyk (EDT)  出版社:Productivity Press  出版日:2015/08/20 裝訂:精裝
Radiation Detectors for Medical Imaging discusses the current state of the art and future prospects of photon-counting detectors for medical imaging applications. Featuring contributions from leading
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Radiation Detection Systems:Medical Imaging, Industrial Testing and Security Applications

4.Radiation Detection Systems:Medical Imaging, Industrial Testing and Security Applications

作者:Iwanczyk; Jan (DxRay Inc.; USA.); Iniewski; Krzysztof  出版社:PBKTYFRL  出版日:2021/11/05 裝訂:精裝
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Radiation Detection Systems:Sensor Materials, Systems, Technology and Characterization Measurements

5.Radiation Detection Systems:Sensor Materials, Systems, Technology and Characterization Measurements

作者:Iniewski; Krzysztof (Redlen Technologies Inc.; Canada.); Iwanczyk; Jan S. (DxRay Inc.; USA.)  出版社:PBKTYFRL  出版日:2021/11/05 裝訂:精裝
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Radiation Detection Systems:Two Volume Set

6.Radiation Detection Systems:Two Volume Set

若需訂購本書,請電洽客服
02-25006600[分機130、131]。

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