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Edited by Patrick W. DeHaven 、David P. Field 、Samuel D. Harkmess 、John A. Sutliff 、Jerzy a. Szpunar 、Li Tang 、Thomas Thomson 、Mark D. Vaudin (1)
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Electron Backscatter Diffraction in Materials Science
作者:Adam J. Schwartz (EDT); Mukul Kumar (EDT); David P. Field (EDT)  出版社:Springer Verlag  出版日:2009/08/21 裝訂:精裝
Electron backscatter diffraction is a very powerful and relatively new materials characterization technique aimed at the determination of crystallographic texture, grain boundary character distributio
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02-25006600[分機130、131]。
Magnetic and Electronic Films – Microstructure, Texture and Application to Data Storage:VOLUME721
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Papers from an April 2002 meeting present recent work on texture and microstructure in electronic and magnetic films, and on nanostructural magnetic materials for data storage, examining areas such as
定價:1665 元, 優惠價:9 1499
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