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2016~2017 (2)
2016年以前 (7)
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平裝 (4)
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作者

Dale Purves (EDT)/ George J. Augustine (EDT)/ David Fitzpatrick (EDT)/ William C. Hall (EDT)/ Anthony-Samuel Lamantia (EDT) (1)
David L. Wagner/ Dale F. Schweitzer/ J. Bolling Sullivan/ Richard C. Reardon (1)
Edited by Tony F. Heinz 、Masaya Iwaki 、Dale C. Jacobson 、David E. Luzzi (1)
Gary H. Lyman (EDT)/ David C. Dale (EDT) (1)
Joseph Goldstein/ Dale E. Newbury/ David C. Joy/ Charles E. Lyman/ Patrick Echlin (1)
Joseph Goldstein/ Dale E. Newbury/ Patrick Echlin/ David C. Joy/ Charles Fiori (1)
Joseph Goldstein/ Dale Newbury/ David C. Joy/ Joseph Michael/ Nicholas W. M. Ritchie (1)
Joseph I. Goldstein (EDT)/ Dale E. Newbury/ Patrick Kchlin/ David C. Joy/ Charles E. Lyman/ Eric Lifshin/ Linda Sawyer/ Joseph R. Michael (1)
Patrick Echlin/ C. E. Fiori/ Joseph Goldstein/ David C. Joy/ Dale E. Newbury (1)
出版社/品牌

Springer Verlag (5)
CAMBRIDGE UNIVERSITY PRESS (1)
Plenum Pub Corp (1)
Princeton Univ Pr (1)
Sinauer Associates Inc (1)

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9筆商品,1/1頁
Hematopoietic Growth Factors in Oncology
作者:Gary H. Lyman (EDT); David C. Dale (EDT)  出版社:Springer Verlag  出版日:2010/11/30 裝訂:精裝
Progress in the treatment of cancer over the past two decades has been rapid with many new and novel therapeutic modalities arriving at an unprecedented pace. Overall cancer mortality rates have actua
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Advanced Scanning Electron Microscopy and X-ray Microanalysis
作者:Patrick Echlin; C. E. Fiori; Joseph Goldstein; David C. Joy; Dale E. Newbury  出版社:Springer Verlag  出版日:2013/06/08 裝訂:平裝
This book has its origins in the intensive short courses on scanning elec- tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide
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02-25006600[分機130、131]。
Beam Solid Interactions for Materials Synthesis and Characterization:VOLUME354
滿額折
作者:Edited by Tony F. Heinz ; Masaya Iwaki ; Dale C. Jacobson ; David E. Luzzi  出版社:CAMBRIDGE UNIVERSITY PRESS  出版日:1995/11/20 裝訂:平裝
Proceedings of the title symposium, held at the 1994 MRS Fall Meeting in Boston, 28 November-2 December 1994. Selected papers that were presented in both oral and poster sessions are divided into six
定價:1665 元, 優惠價:9 1499
無庫存,下單後進貨(到貨天數約30-45天)
Scanning Electron Microscopy and X-ray Microanalysis
作者:Joseph Goldstein; Dale Newbury; David C. Joy; Joseph Michael; Nicholas W. M. Ritchie  出版社:Springer Verlag  出版日:2017/12/16 裝訂:精裝
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Scanning Electron Microscopy and X-ray Microanalysis ― A Text for Biologists, Materials Scientists, and Geologists
作者:Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Charles Fiori  出版社:Springer Verlag  出版日:2013/03/20 裝訂:平裝
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors wit
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Owlet Caterpillars of Eastern North America
90折
作者:David L. Wagner; Dale F. Schweitzer; J. Bolling Sullivan; Richard C. Reardon  出版社:Princeton Univ Pr  出版日:2011/12/27 裝訂:平裝
This lavishly illustrated field guide features more than 800 species of the most common, interesting, beautiful, and important owlet (noctuid) caterpillars found in eastern North America. More than 2,
定價:1400 元, 優惠價:9 1260
無庫存,下單後進貨(到貨天數約30-45天)
Scanning Electron Microscopy and X-Ray Microanalysis
作者:Joseph Goldstein; Dale E. Newbury; David C. Joy; Charles E. Lyman; Patrick Echlin  出版社:Springer Verlag  出版日:2013/05/31 裝訂:平裝
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical a
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Neuroscience
This comprehensive textbook provides a balance of animal and human studies to discuss the dynamic field of neuroscience from cellular signaling to cognitive function. The book's length and accessible
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02-25006600[分機130、131]。
Scanning Electron Microscopy and X-Ray Microanalysis
Providing acomprehensive introduction to the capabilities and use of scanning electron microscopes (SEM) and x-ray spectrometers, this highly acclaimed text emphasizes practical aspects of imag
若需訂購本書,請電洽客服
02-25006600[分機130、131]。

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