Theory and Practice of Quality and Reliability Engineering in Asia Industry

This book discusses the application of quality and reliability engineering in Asian industries, and offers information for multinational companies (MNC) looking to transfer some of their operation and manufacturing capabilities to Asia and at the same time maintain high levels of reliability and quality. It is also provides small and medium enterprises (SME) in Asia with insights into producing high-quality and reliable products. It mainly comprises peer-reviewed papers that were presented at the Asian Network for Quality (ANQ) Congress 2014 held in Singapore (August, 2014), which provides a platform for companies, especially those within Asia where rapid changes and growth in manufacturing are taking place, to present their quality and reliability practices. The book presents practical demonstrations of how quality and reliability methodologies can be modified for the unique Asian market, and as such is a valuable resource for students, academics, professionals and practitioners in the field of quality and reliability.

Professor Cher Ming Tan is director of the Centre for Reliability Sciences and Technologies (CReST) at Chang Gung University, Taiwan and a professor at the College of Engineering Electronic department. He is also a chair professor at Ming Chi University of Technology, Taiwan. He was a faculty member of the Nanyang Technological University, Singapore for more than 19 years before moving to his current position. He started his reliability work in 1984 with Fairchild Semiconductor and later pursued his master’s and Ph.D at the University of Toronto, Canada. He then joined Lite-On Power Semiconductor, Taiwan, continuing his work on quality, reliability and failure analysis. In addition he offers training and consultation to companies around the globe. He is an editor of IEEE Transaction on Device and Materials Reliability as well as Scientific Report, and is chief editor of SpringerBrief on Reliability, advisory board member of Microelectronics Reliability, and IEEE distinguished lecturer of EDS in Reliability. He was the course coordinator of the Singapore Quality Institute’s Certified Reliability program.

Dr. T. N. Goh holds a Bachelor of Engineering (BE) degree from the University of Saskatchewan, Canada (1969) and PhD from the University of Wisconsin-Madison, USA (1973). He is formerly Head of the Department of Industrial and Systems Engineering and Dean of Faculty of Engineering at the National University of Singapore (NUS). He is Honorary Member of the Singapore Quality Institute (SQI), Fellow of the Academy of Engineering Singapore, and a registered professional engineer. He is an Academician and a member of the Board of Governors, International Academy for Quality (IAQ) and Fellow of the American Society for Quality (ASQ), among other senior professional memberships. Dr. Goh specializes in the application of statistical methodologies to Quality Engineering and Management. He has authored or coauthored some three hundred peer-reviewed technical papers and five advanced books in this field; currently he is on the editorial boards of more than ten international research journals. Dr. Goh has been a frequent invited speaker at professional conferences and corporate events worldwide; recent international honors and awards include: IEEE “Educator of the Year” award in 2005, IAQ’s inaugural Masing Book Prize in 2006 (for the book Six Sigma: Advanced Tools for Black Belts and Master Black Belts, Wiley, UK, 2005), ASQ Statistics Division’s William G Hunter Award in 2007, Asia-Pacific Quality Organization’s Harrington-Ishikawa Medal in 2010, and ASQ’s Grant Medal in 2012. Dr. Goh has served in three preliminary rounds of judging for ASQ’s International Team Excellence Award, and twice in ASQ’s Future Studies mapping developments and trends in the field of Quality.