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【簡體曬書區】 單本79折,5本7折,活動好評延長至5/31,趕緊把握這一波!

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2016年以前 (2)

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Edited by Osamu Ueda 、Mitsuo Fukuda 、Stephen J. Pearton 、Edwin L. Piner 、Paolo Montangero (1)
Laurent Bechou/ Mitsuo Fukuda/ Giovanna Mura/ Massimo Vanzi (EDT) (1)
Osamu Ueda (EDT)/ Mitsuo Fukuda (EDT)/ Kenji Shiojima (EDT)/ Edward Piner (EDT) (1)

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CAMBRIDGE UNIVERSITY PRESS (2)
Elsevier Science Ltd (1)

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Advanced Laser Diode Reliability

1.Advanced Laser Diode Reliability

作者:Laurent Bechou; Mitsuo Fukuda; Giovanna Mura; Massimo Vanzi (EDT)  出版社:Elsevier Science Ltd  出版日:2020/12/01 裝訂:精裝
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Reliability and Materials Issues of Iii-v and Ii-vi Semiconductor Optical and Electron Devices and Materials II

3.Reliability and Materials Issues of Iii-v and Ii-vi Semiconductor Optical and Electron Devices and Materials II

作者:Osamu Ueda (EDT); Mitsuo Fukuda (EDT); Kenji Shiojima (EDT); Edward Piner (EDT)  出版社:CAMBRIDGE UNIVERSITY PRESS  出版日:2012/08/27 裝訂:精裝
Symposium G was held April 9-13 at the 2012 MRS Spring Meeting.
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